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electron-microscope study

См. также в других словарях:

  • transmission electron microscope study — tyrimas peršviečiamuoju elektroniniu mikroskopu statusas T sritis radioelektronika atitikmenys: angl. transmission electron microscope study vok. Durchstrahlungselektronenmikroskop Untersuchung, f rus. исследование просвечивающим электронным… …   Radioelektronikos terminų žodynas

  • Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

  • electron microscope — a microscope of extremely high power that uses beams of electrons focused by magnetic lenses instead of rays of light, the magnified image being formed on a fluorescent screen or recorded on a photographic plate: its magnification is… …   Universalium

  • Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

  • Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

  • Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… …   Wikipedia

  • Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… …   Wikipedia

  • Electron crystallography — is a method to determine the arrangement of atoms in solids using a transmission electron microscope (TEM). Contents 1 Comparison with X ray crystallography 2 Radiation damage 3 Protein structures determined by electron crystallography …   Wikipedia

  • Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …   Wikipedia

  • Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

  • Electron holography — is the application of holography techniques to electron waves rather than light waves.Illumination sourcePoint like field emission sources are the appropriate sources for coherent electron waves. Unlike optical sources, the wavelength is not… …   Wikipedia

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